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9th IUVSTA school

International Summer School on Physics at Nanoscale

16th - 21th June 2008
Devět Skal, Czech Republic

Notification


The posters are not available through the summer school web page.
If you are interested, please contact the organizers or directly the authors.





Posters

K. Štyndlová, M. Weisserová, A. Fojtík Bactericidal effect of metal nanoparticles and their characterization

R. Hanzlíková, I. Müllerová, M. Holá, Z. Pavloušková SEM and EDS analyses used for characterization of ceramic materials

J. Vyskočil, A. Hospodková, J. Pangrác, K. Melichar, J. Oswald, K. Kuldová, T. Mates, T. Šimeček, E. Hulicius Reflectance Anisotropy Spectroscopy and properties of InAs/GaAs quantum dot structures grown by MOVPE

V. Uhlíř, S. Pizzini, J. Vogel, S. Laribi, E. Bonet-Orozco, M. Bonfim, L. Ranno Time-resolved observation of Domain Wall Depinning and Propagation in Spin-valve Nanowires

M. Rahman, N. Tahavinia, S. Shahrokhian, A. Irajizad TiO2 thin Films as Electrodes of Photoelectrochemical Cells (Layer-by-layer Self Assembly Method)

F. Novotný, A. Fojtík, F. Giersig Gold particle nanostructure: Synthesis and characterization

N. Tesařová, E. Rozkotová, D. Sprinzl, F. Trojánek, P. Malý, P. Němec Light-induced Precession of Magnetization in Ferromagnetic Semiconductor (Ga, Mn)As

Z. Mics, P. Kužel, P. Jungwirth, S. E. Bradforth Photoionization of Atmospheric Gases Probed by terahertz Pulses

K. Dohnalová, P. Gilliot, M. Gallart, O. Crégut, J.-L. Rehspringer, K. Kůsová, K. Herynková, T. Ostatnický, S. Bakardjeva, I. Pelant, B. Hönerlage Closely Packed luminescent silicon nanocrystals in a distributed-feedback laser cavity

M. Berta, S. Danylyuk, F. Kadlec, P. Kužel, N. Klein Terahertz near-field spectroscopy and microscopy based on metal-dielectric antenna

K. Kůsová, O. Cibulka, K. Dohnalová, I. Pelant, A. Fučíková, J. Valenta Yellow-emitting colloidal suspensions of silicon nanocrystals: Fabrication technology, luminiscence performance and application prospect

L. Volkovynska, V.M. Ogenko, V.I. Grygoruk Synthesis of nanostructures on a Fiber nanoneedles surface

A. Vetushka, M. Ledinský, A. Fejfar, J. Kočka Raman Measurement of Intrinsic Stress in Nanocrystalline Silicon Thin Films

J. Čermák, A. Kromka, B. Rezek Localised charging of oxidised Nano-crystalline diamond surfaces by AFM tip

M. Ledinský, A. Vetushka, J. Stuchlík, J. Čermák, B. Rezek, A. Fejfar, J. Kočka Micro-Raman spectroscopy

M. Kolíbal, T. Čechal, J. Čechal, J. Brandejsová, T. Šikola Self-limiting cyclic growth of Ga droplets on Si(111)

S. Průša, M. Kolíbal, J. Čechal, O. Tomanec, J. Luksch, M. Plojhar, J. Spousta, T. Šikola Low Energy Ion Scattering on Co/Si(111) (7x7) system

J. Mach, S. Voborný, D. Škoda, J. Čechal, M. Potoček, J. Spousta, T. Šikola Analysis of GaN Ultrathin Films Grown by Ion-Atom Beam Source

J. Mach, J. Čechal, M. Kolíbal, M. Potoček, J. Spousta, T. Šikola The Design and Application of Hydrogen Atom Beam Source for Cleaning and Modification of Surfaces and Ultrathin Films

P. Babor, M. Potoček, J. Neuman, S. Voborný, M. Urbánek, J. Polčák, S. Průša, M. Kolíbal, J. Spousta, L. Dittrichová, J. Sobota, Z. Bochníček, R. Roučka, J. Kouvetakis, T. Šikola Depth Profiling of Mo/Si multi-nano-layers by DSIMS and HRTEM

J. Polčák, J. Čechal, P. Babor, J. Brandejsová, O. Tomanec, J. Spousta, Z. Bochníček, J. Sobota, T. Šikola Nondestructive depth profiling of ultrathin films by AR XPS and XRR

M. Bartošík, D. Škoda, O. Tomanec, R. Kalousek, P. Jánský, T. Šikola The Influence of Humidity on the kinetic of local anodic oxidation

M. Bartošík, M. Kolíbal, J. Mach, J. Luksch, J. Čechal, R. Kalousek, J. Spousta, T. Šikola Fabrication of Nanostructures by Selective Growth

J. Čechal, O. Tomanec, D. Škoda, K. Koňáková, J. Mach, M. Kolíbal, T. Šikola Selective growth of Co nanodots on ion beam induced nucleation centers in native SiO2

J. Čechal, J. Luksch, K. Koňáková, M. Urbánek, R. Kalousek, P. Dub, T. Šikola A temperature dependence of cobalt growth on native SiO2

L. Válek, J. Šík Defects in Czochralski Silicon Crystals

P. Kostelník, J. Šík Measurement of silicon wafer microroughness using AFM

S. Voborný, J. Pokorný, J. Mach, O. Tomanec, J. Čechal, L. Dittrichová, J. Spousta, T. Šikola Study of Initial Periods of Low-Temperature GaN Ultrathin Films Growth

L. Kotačka, R. Plšek Diffraction on quasi-periodical Structures: Vectorial Approach

N. Nevil, A. Aguirre, A. de Backer, V. Immanuel, E. Goovaerts, L. Lutsen, J-C. Bolsee Optical Spectroscopic and AFM Studies of Charge Transfer in PPV/ Fullerene Blends for Application in 3D  Heterojunction Solar Cells

L. Břínek, O. Tomanec, R. Kalousek, P. Dub, T. Šikola Plasmonic Resonant Antenas Numerical and Experimental Study

L. Šustr, L. Lovicar, O. Tomanec, R. Kalousek, P. Dub, T. Šikola Excitation and Detection of Surface Plasmon Polaritons

K. Kazlauskas, P. Vitta, A. Žukauskas, A. Dementjev, V. Gulbinas, L. Valkunas, N.Ostapenko, S. Suto Temperature independent exciton relaxation in poly(di-n-hexylsilane) confined in nanoporous silica

J. Holovský, A. Poruba, J. Bailat, M. Vaněček Separation of signals from amorphous and microcrystalline part of a tandem thin film silicon solar cell in Fourier Transform Photocurrent Spectroscopy

M. Shalom, S. Dor, A. Zaban Chemical Bath Deposition of CdS Quantuum dots auto Mesoscopic TiO2 Films for Application in Quantuum-Dot-Sensitised Solar Cells

L. Yu Faceting growth of Si nano wire (SINW)/nano pillar (SINP) structures

J. Tuček, J. Čuda, R. Zbořil, M. Mashlan Magnetism of non-bearing nanoparticle systems

Z. Tachan, L. Griniss, A. Zaban Dye Sensitized Solar Cells fabrication by EPD

A. Purkrt, J. Holovský, L. Hoďáková, A. Poruba, Z. Remeš, M. Vaněček PHOTOVOLTAICS GROUP at Institute of Physics of the Academy of Sciences of the Czech Republic, v.v.i., Prague

Organizers
IUVSTA
Czech Nanoteam
Brno University of Technology
Institute of Physics AS CR
Charles University
Masaryk University
Czech Technical University
J. E. Purkinje University in Usti nad Labem
Czech Physical Society
Czech Vacuum Society
Sponsors
Q-Cells AG OT Thalheim
SHM
ON Semiconductor
Uni-Export Instruments
HVM Plasma
TESCAN
Spolchemie
Oerlikon Solar
FEI Czech Republic
Pragolab
RMI, s.r.o.
Omicron NanoTechnology GmbH
Pfeiffer Vacuum Austria GmbH
Optaglio
MBSS Science Service
H-TEST a.s.
OPTIK INSTRUMENTS
LABIMEX
CHROMSPEC
Renishaw

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2008